Ӧ�ø���ͳ�� 2013, 29(2) 213-224 DOI:      ISSN: 1001-4268 CN: 31-1256

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Optimal Design of Accelerated Degradation Test based on Gamma Process Models
Guan Qiang, Tang Yincai
School of Finance and Statistics, East China Normal University, Institute of Information Engineering, Sanming University
Abstract:

In this paper, optimal constant-stress
accelerated degradation test plans are developed under the
assumption that the degradation characteristic follows a Gamma
processes. The test stress levels and the proportion of units
allocated to each stress level are determined by D-criterion and
V-criterion. The general equivalence theorem (GET) is used to
verify that the optimized test plans are globally optimum. In
addition, compromise test plans are also studied. Finally, an
example is provided to illustrate the proposed method and a
sensitivity analysis is conducted to investigate the robustness of
optimal plans.

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