Software Defect Prediction Model Based on Maximal Information Coefficient

CUI Jun; LIU Yana; GUO Xinfeng; WANG Ruibo; LI Jihong

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CHINESE JOURNAL OF APPLIED PROBABILITY AND STATISTICS ›› 2019, Vol. 35 ›› Issue (1) : 86-108. DOI: 10.3969/j.issn.1001-4268.2019.01.007
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Software Defect Prediction Model Based on Maximal Information Coefficient

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2019, 35(1): 86-108 https://doi.org/10.3969/j.issn.1001-4268.2019.01.007

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