应用概率统计
          Home |   About Journal | Editorial | Instruction | Subscription | Contact Us | Chinese
CHINESE JOURNAL OF APPLIED PROBABILITY AND STATIST
article Current Issue| Next Issue| Archive| Adv Search |
Empirical Likelihood Test for Stationary Short Memory Time Series Models
ZHANG Xiuzhen; LU Zhiping; LI Mengke; ZHANG Tengfei; LIN Junjie
School of Statistics, East China Normal University, Shanghai, 200241, China; School of Mathematics and Statistics, Shanxi Datong University, Datong, 037009, China

  Copyright © 2006 Editorial By��CHINESE JOURNAL OF APPLIED PROBABILITY AND STATISTICS��
Support by Beijing Magtech Co.ltd  support@magtech.com.cn