An Overview on Statistical Analysis for Masked System Lifetime Data

System failure data from engineering applications under a competing risks framework is widespread. As a special form of these data, masked data plays an important role in engineering. First, we illustrate the form of masked data and distinguish it from the usual competing risk data. Then for series systems or parallel systems, two approaches (maximum likelihood method and Bayesian method) are introduced to analyze the masked data, and a real data set is analyzed by the two methods.