Criteria for Exponential Decay of Symmetric Jump Processes

ZHANG Longteng; CHEN Qinghua

doi:10.12460/j.issn.1001-4268.aps.2025.2023060

ZHANG Longteng, CHEN Qinghua. Criteria for Exponential Decay of Symmetric Jump ProcessesJ. Chinese Journal of Applied Probability and Statistics, 2025, 41(3): 404-413. DOI: 10.12460/j.issn.1001-4268.aps.2025.2023060

Citation:

ZHANG Longteng, CHEN Qinghua. Criteria for Exponential Decay of Symmetric Jump ProcessesJ. Chinese Journal of Applied Probability and Statistics, 2025, 41(3): 404-413. DOI: 10.12460/j.issn.1001-4268.aps.2025.2023060

Citation:

ZHANG Longteng, CHEN Qinghua. Criteria for Exponential Decay of Symmetric Jump ProcessesJ. Chinese Journal of Applied Probability and Statistics, 2025, 41(3): 404-413. DOI: 10.12460/j.issn.1001-4268.aps.2025.2023060

Criteria for Exponential Decay of Symmetric Jump Processes

Abstract

Abstract

We present two kinds of suffcient conditions for the exponential decay of symmetric jump processes. These conditions are analogous to the Meyn-Tweedie's drift conditions for exponentially ergodic Markov processes. These criteria are based on the drift condition for the Dirichlet eigenvalue and the theory of h-transform operator, respectively.

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Criteria for Exponential Decay of Symmetric Jump Processes

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