CHEN Jiading, GAO Huixuan, DAI Zhongwei, FANG Xiangzhong. The Sequential Tests for Success Ratio and the Confidence Limits of Success Ratio after TestingJ. Chinese Journal of Applied Probability and Statistics, 1997, 13(4): 367-374.
Citation: CHEN Jiading, GAO Huixuan, DAI Zhongwei, FANG Xiangzhong. The Sequential Tests for Success Ratio and the Confidence Limits of Success Ratio after TestingJ. Chinese Journal of Applied Probability and Statistics, 1997, 13(4): 367-374.

The Sequential Tests for Success Ratio and the Confidence Limits of Success Ratio after Testing

  • Let Xi,i≥1 be a sequence of i.i. d. r.v.’s satisfying q=P(Xi=0)=1-P(Xi=1),q is unknown. Suppose that An:1≤n≤n0 and Rn:1≤n≤n0 are any two sets of numbers satisfying A1≤A2≤…≤An0,0<R1≤R2≤…≤Rn0,Ai<Ri(i=1,…,no-1) and An0=RnoRn0.
    For the hypothesis H0:q≥q0(0<q0<1), We consider the sequential test △=(r,d) in which r=min{n:n1,Dn≤AnorDn≥Rn, d=I(Dr≥Rr), where D_n=\sum_i=1^n X_i(n \geq 1).IA is the indicator of set A, “d =1” means rejecting H0 and “d = 0” means accepting H0. In the present paper, we find out the optimal lower (upper) confidence limits for q based on data (r,Dr) in some sence
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