The Sequential Tests for Success Ratio and the Confidence Limits of Success Ratio after Testing
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Graphical Abstract
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Abstract
Let Xi,i≥1 be a sequence of i.i. d. r.v.’s satisfying q=P(Xi=0)=1-P(Xi=1),q is unknown. Suppose that An:1≤n≤n0 and Rn:1≤n≤n0 are any two sets of numbers satisfying A1≤A2≤…≤An0,0<R1≤R2≤…≤Rn0,Ai<Ri(i=1,…,no-1) and An0=RnoRn0.
For the hypothesis H0:q≥q0(0<q0<1), We consider the sequential test △=(r,d) in which r=min{n:n1,Dn≤AnorDn≥Rn, d=I(Dr≥Rr), where D_n=\sum_i=1^n X_i(n \geq 1).IA is the indicator of set A, “d =1” means rejecting H0 and “d = 0” means accepting H0. In the present paper, we find out the optimal lower (upper) confidence limits for q based on data (r,Dr) in some sence
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