V.E.Bening, ZHAO Xuanmin, V.Yu.Korolev. Edgeworth Expansions and Power Loss of Tests[J]. Chinese Journal of Applied Probability and Statistics, 2001, 17(3): 291-299.
Citation:
V.E.Bening, ZHAO Xuanmin, V.Yu.Korolev. Edgeworth Expansions and Power Loss of Tests[J]. Chinese Journal of Applied Probability and Statistics, 2001, 17(3): 291-299.
V.E.Bening, ZHAO Xuanmin, V.Yu.Korolev. Edgeworth Expansions and Power Loss of Tests[J]. Chinese Journal of Applied Probability and Statistics, 2001, 17(3): 291-299.
Citation:
V.E.Bening, ZHAO Xuanmin, V.Yu.Korolev. Edgeworth Expansions and Power Loss of Tests[J]. Chinese Journal of Applied Probability and Statistics, 2001, 17(3): 291-299.
This paper deals with the Edgeworth expansions and power loss of tests for the one-sample problem. The first-order asymptotic theory second order efficiency and power loss are given. The tests based on L-, R-, U-statistics and combined L-statistics are studied.