WEI Xuelian, CHEN Jiading. An Improvement for the Fixed-duration Test Plans in MIL-HDBK-781 and IEC61124 (2002) Draft[J]. Chinese Journal of Applied Probability and Statistics, 2004, 20(4): 414-428.
Citation: WEI Xuelian, CHEN Jiading. An Improvement for the Fixed-duration Test Plans in MIL-HDBK-781 and IEC61124 (2002) Draft[J]. Chinese Journal of Applied Probability and Statistics, 2004, 20(4): 414-428.

An Improvement for the Fixed-duration Test Plans in MIL-HDBK-781 and IEC61124 (2002) Draft

  • In this paper, the shortcoming for the fixed-duration test plans in MIL-HDBK-781 and IEC61124 (2002) draft are pointed, and a new class of fixed time/failure terminated test plans with two stages is proposed. For each plan in the new class, the difference between the practical risk and nominal risk is not exceed 5 × 10-4 and the less total test time is needed. Meanwhile, a detailed algorithm and a software are provided to calculate the confidence limit of reliability parameter θ(MTBF) for all test plans of the new class.
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