A Bayesian Zero-Failure Reliability Demonstraion Testing Procedure for Lognormal Distribution

Assume the life t of product abides by the lognormal distribution, i.e. t~LN(μ,σ²), where μis called location parameter, σis called scale parameter. In this paper a Bayesian Zero-Failure reliability demonstraion testing procedure is given for each of the two cases as follows: (1) μis unknown, σ² is known,(2)μand σ² are unknown. For each case, we give a concrete example.