Software Defect Prediction Model Based on Maximal Information Coefficient
CUI Jun; LIU Yana; GUO Xinfeng; WANG Ruibo; LI Jihong
CHINESE JOURNAL OF APPLIED PROBABILITY AND STATIST . 2019, (1): 86 -108 .  DOI: 10.3969/j.issn.1001-4268.2019.01.007

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