年龄点t0之后的NBU性的非参数检验方法

Nonparametric Test for Whether New is Strictly Better than Used since Age to

  • 摘要: NBU*to寿命分布中新元件的寿命随机地大于旧的年龄不小于to的元件的剩余寿命,这为更广泛地模拟元件的老化和劣化现象提供了丰富的内容.本文首先对那些to年龄点之后剩余寿命随机等于新元件寿命的元件的结构加以刻画,然后建立了一个非参数检验方法以区分这种随机等价性和to年龄点后的严格的NBU性,并给出了针对一个NBU*to但非NBU的寿命分布的例子的数值模拟结果。

     

    Abstract: NBU*to class of life distributions, characterized by the fact that a new item has a stochatically larger life length than the residual life length after a certain age to>0, is studied in this.paper, we first provide a characterization for those the residual life of a used one with age not less than to>0 is stochastically equivalent to that of a new one. Furthermore, a nonparametric test is designed so as to test the stochastic equivalence between the life length of a new item and that of a used one with an age greater than to, against the alternative, that there is a great tendency for a new item to have a strictly longer life length than does a used one with age not smaller than to. Since computer-intensive method is avoided, it is simpler and more convenient than that in Zehui, Li and Xiaohu, Li. Finally, some numerical simulations are presented.

     

/

返回文章
返回