无替换试验下的截尾序贯最优检验研究

Reserch on optimal truncated sequential test scheme without substitution

  • 摘要: 为降低具有“高可靠、长寿命”试验特点产品的抽样检验成本, 本文对无替换试验下的指数分布计量型截尾序贯最优检验进行了研究。建立了无替换试验下截尾序贯最优检验的相关理论, 给出了检验方案的操作特征曲线与平均累积自然日历试验时间等关键统计特征量的计算表达式, 并构建了样本空间排序法对截尾序贯最优检验方案进行求解。与当前国际标准IEC61124中有替换试验下的截尾序贯检验方案相比, 本文所建立的新检验方案在检验水平得到严格控制的条件下, 能降低综合平均自然日历时间的比例接近80%。与有替换试验下的截尾序贯最优检验方案相比, 本文所建立的新方案亦能降低综合平均自然日历时间的比例均在70%左右。本文所建立的方案大幅度降低了产品抽样检验的综合平均自然日历时间, 因而能极大地节省“高可靠、长寿命”试验特点产品抽样检验的试验成本。

     

    Abstract: In order to save the test cost for products with high-reliability and long-life testing characteristics, the optimal truncated sequential tests of exponential distribution without substitution is studied in this paper. The theory of truncated sequential optimal test without substitution test is established. The calculation expressions of key statistical feature indexes such as the operating characteristic curve and expected natural calendar test time of the test plans are derived. Sample space sorting method has also been established to solve the optimal truncated sequence test. Through comparison with the test plans provided by the international standard IEC61124, the results show that, as the type I and type II errors probabilities have been strictly controlled, the new test plan proposed here can save nearly 80% of synthesis expected natural calendar test time simultaneously. Moreover, through comparison with the optimal truncated sequential test with substitution, the results show that, the new test plans can reduce nearly 70% of the synthesis expected natural calendar test time. The plans established in this paper significantly reduces the synthesis expected natural calendar test time of the test, thus significantly saving the test cost for products with high-reliability and long-life testing characteristics.

     

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