张龙腾, 陈庆华. 可配称跳过程指数衰减的判别条件[J]. 应用概率统计, 2025, 41(3): 404-413. DOI: 10.12460/j.issn.1001-4268.aps.2025.2023060
引用本文: 张龙腾, 陈庆华. 可配称跳过程指数衰减的判别条件[J]. 应用概率统计, 2025, 41(3): 404-413. DOI: 10.12460/j.issn.1001-4268.aps.2025.2023060
ZHANG Longteng, CHEN Qinghua, . Criteria for Exponential Decay of Symmetric Jump Processes[J]. Chinese Journal of Applied Probability and Statistics, 2025, 41(3): 404-413.
Citation: ZHANG Longteng, CHEN Qinghua, . Criteria for Exponential Decay of Symmetric Jump Processes[J]. Chinese Journal of Applied Probability and Statistics, 2025, 41(3): 404-413.

可配称跳过程指数衰减的判别条件

Criteria for Exponential Decay of Symmetric Jump Processes

  • 摘要: 本文给出了可配称跳过程指数衰减的两个判别条件,它们类似于马氏过程指数遍历的MeynTweedie漂移条件.这两个判别条件的构造分别基于Dirichlet特征值的漂移条件和h变换算子理论.

     

    Abstract: We present two kinds of suffcient conditions for the exponential decay of symmetric jump processes. These conditions are analogous to the Meyn-Tweedie’s drift conditions for exponentially ergodic Markov processes. These criteria are based on the drift condition for the Dirichlet eigenvalue and the theory of h-transform operator, respectively.

     

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