残差X-图对平稳可逆ARMA过程数据的检验能力
Detection Capability of Residual X-Chart for Stationary Reversible ARMA Process Data
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摘要: 本文将SPC (Statistical Process Control)技术应用于自相关数据,使用的基本方法是对数据做残差处理,本文给出了对于平稳可逆的ARMA过程数据,在检验过程均值变化方面,残差X-图优于X-图的条件。Abstract: In the statistical process control environment a primary method to deal with auto-correlated data is the use of a residual chart. The detection capability of the residual X-Chart for the stationary reversible ARMA process will be studied in this paper. Conditions under which the residual X-Chart reduces or increases the detection capability are given.